In this webinar, we’ll discuss various aspects of Raman, including the reasons the industry is interested in the technology, data integrity, method development, how samples are scanned, and challenges that have been conquered. We’ll also discuss the importance of validation of instrumentation, how PIC/S is influencing the move towards 100% container testing globally, and how handheld Raman technology can help to achieve it.
|SciX Conference – Metrohm USA, Booth Number 131 – Rhode Island Convention Center, Providence, RI|
313 Enterprise Drive
Plainsboro, NJ 08536
Fax: +1.302. 368.7830
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